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Volumn 42, Issue 14, 2001, Pages 6259-6270
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Atomic force microscopy investigation of filled elastomers and comparison with transmission electron microscopy - Application to silica-filled silicone elastomers
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Author keywords
Atomic force microscopy; Filled elastomers; Filler dispersion
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CANTILEVER BEAMS;
DISPERSIONS;
OSCILLATIONS;
SILICA;
SILICONES;
STIFFNESS;
TRANSMISSION ELECTRON MICROSCOPY;
SILICA-FILLED SILICONES;
ELASTOMERS;
ELASTOMER;
FILLER;
RUBBER;
SILICON DIOXIDE;
SILICONE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
DISPERSION;
IMAGE QUALITY;
INTERMETHOD COMPARISON;
MOLECULAR INTERACTION;
OSCILLATION;
PHASE TRANSITION;
RIGIDITY;
STRUCTURE ANALYSIS;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 0035917766
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-3861(01)00058-1 Document Type: Article |
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Times cited : (52)
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References (18)
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