Morphology and optical properties of island metal films on semiconductor surface

Scripta Materialia

Volumn 44, Issue 8-9, 2001, Pages 1199-1202

  Dmitruk, N ^a   Dmitruk, I ^b   Romaniuk, V ^a   Mikhailik, T ^a   Wagner, T ^c  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

^c LOT Oriel GmbH   (Germany)

Author keywords

Atomic force microscopy; Dielectric permittivity; Optical spectroscopy; Semiconductors; Transmission electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTRODEPOSITION; GOLD; MORPHOLOGY; OPTICAL PROPERTIES; PERMITTIVITY; SEMICONDUCTING GALLIUM ARSENIDE; TRANSMISSION ELECTRON MICROSCOPY;

OPTICAL SPECTROSCOPY;

METALLIC FILMS;

EID: 0035906590     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(01)00682-0     Document Type: Article

References (5)