Electrochemical characterization of self-assembled alkylsiloxane monolayers on Indium-Tin oxide (ITO) semiconductor electrodes

Journal of Physical Chemistry B

Volumn 105, Issue 19, 2001, Pages 4270-4276

  Hillebrandt, Heiko ^a   Tanaka, Motomu ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMPEDANCE SPECTROSCOPY; INDIUM TIN OXIDE; OCTYLTRIMETHOXYSILANE; SELF ASSEMBLED ALKYLSILOXANE MONOLAYERS; SEMICONDUCTOR ELECTRODES;

CHARGE TRANSFER; CONTACT ANGLE; CYCLIC VOLTAMMETRY; DIFFUSION IN SOLIDS; ELECTROCHEMISTRY; HYDROPHOBICITY; INTERFACES (MATERIALS); POLYCRYSTALLINE MATERIALS; SELF ASSEMBLY; SEMICONDUCTOR DEVICES; SURFACE ROUGHNESS; THICKNESS MEASUREMENT;

INDIUM COMPOUNDS;

EID: 0035902331     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp004062n     Document Type: Article

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