Near field or far field?

EDN

Volumn 46, Issue 18, 2001, Pages 95-102

  Capps, Charles ^a,b,c,d  

^a DELPHI CORPORATION   (United States)

^b Delphi Automotive   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035899425     PISSN: 00127515     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (9)

1. Ott, HW, Noise Reduction Techniques in Electronic Systems, Second Edition, John Wiley Interscience, New York, NY, 1988.
2. Mardiguian, Michel, Interference Control in Computer and Microprocessor-Based Equipment, EEC Press.
3. Paul, CR, Introduction to Electro-magnetic Compatibility, John Wiley Interscience, New York, NY, 1992.
4. White, Don, EMI Control Methods and Techniques: Volumes 1 through 5, Don White Consultants, Gainesville, VA.
5. Keiser, Bernard, Principles of Electromagnetic Compatibility, Artech House, Norwood, MA.
6. Measurement of Electromagnetic Interference Characteristics, Department of Defense, MIL-STD 462, July 1967.
7. Measurement of Electromagnetic Interference Characteristics, Department of Defense, MIL-STD 449, July 1967.
8. Krause, John, Antennas, McGraw-Hill, New York, NY, 1950.
9. Berkowitz, Bernard, Basic Microwaves, Hayden, New York, NY, 1966.