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Applied Physics Letters

Volumn 79, Issue 3, 2001, Pages 385-387

Structural and ferromagnetic resonance characteristics of BaFe12O19 films with minimal linewidths

(5) Saraf, L V a Lofland, S E a Cresce, A V a Bhagat, S M a Ramesh, R a

a UNIVERSITY OF MARYLAND (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ANNEALING; BARIUM COMPOUNDS; DISLOCATIONS (CRYSTALS); FERROMAGNETIC RESONANCE; FILM GROWTH; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STRAIN; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION;

MAGNETOCRYSTALLINE ENERGY; MAGNETOELASTICITY;

METALLIC FILMS;

EID: 0035898321 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1385348 Document Type: Article

Times cited : (16)

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