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Physical Review Letters

Volumn 86, Issue 16, 2001, Pages 3642-3645

Phase transitions, stability, and dielectric response of the domain structure in ferroelectric-ferroelastic thin films

(2) Bratkovsky, A M a Levanyuk, A P a,b

a HEWLETT PACKARD LABORATORIES (United States)

b UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DIELECTRIC PROPERTIES; ELASTIC MODULI; FERROELECTRIC MATERIALS; FOURIER TRANSFORMS; MATHEMATICAL MODELS; PHASE TRANSITIONS; STRAIN; STRUCTURE (COMPOSITION); SUBSTRATES; TENSORS; VECTORS;

DIELECTRIC RESPONSE; ELASTICALLY ISOTROPIC SUBSTRATE; FERROELASTIC THIN FILM; FERROELECTRIC THIN FILM; FILM THICKNESS; LANDAU THERMODYNAMIC POTENTIAL;

THIN FILMS;

EID: 0035896856 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.86.3642 Document Type: Article

Times cited : (44)

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