Transverse field dependence of the planar Hall effect sensitivity in Permalloy films

Journal of Applied Physics

Volumn 90, Issue 12, 2001, Pages 6297-6301

  Jen, S U ^a   Lee, J Y ^a   Yao, Y D ^a   Chen, W L ^a  

^a INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035894151     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1415052     Document Type: Article

References (13)

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9. max of the square sample is even higher, about 465 /T.
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