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Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 23, 2001, Pages 2353251-23532520

Random berry phase magnetoresistance as a probe of interface roughness in Si MOSFET'S

(2) Mathur, H a Baranger, H U a

a CASE WESTERN RESERVE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; CONDUCTANCE; ELECTRON TRANSPORT; MAGNETIC FIELD; PHASE TRANSITION; QUANTUM THEORY; SAMPLING; SEMICONDUCTOR;

EID: 0035893966 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (47)

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