|
Volumn 20, Issue 24, 2001, Pages 2243-2244
|
Correction of negative deviation from Debye's theory
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRON DENSITY MEASUREMENT;
GRAIN BOUNDARIES;
INTERFACES (MATERIALS);
MATHEMATICAL MODELS;
THICKNESS MEASUREMENT;
DEBYE THEORY;
HIGH ANGLE SCATTERING;
X RAY WAVELENGTH;
X RAY SCATTERING;
|
EID: 0035892520
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1017905622321 Document Type: Article |
Times cited : (5)
|
References (4)
|