Erratum: Electrostatic screening near semiconductor surfaces (Phys. Rev. B (61) 13821 (2000))

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 19, 2001, Pages 1999011-

  Krcmar M ^a   Saslow, W M ^a   Weimer, M B ^a  

^a NONE

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ERRATUM; ERROR;

EID: 0035891202     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Erratum

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