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Volumn 73, Issue 22, 2001, Pages 5551-5556

On-chip integration of sequential ion-sensing system based on intermittent reagent pumping and formation of two-layer flow

Author keywords

[No Author keywords available]

Indexed keywords

ION-SENSING SYSTEMS; THERMAL LENS MICROSCOPY (TLM);

EID: 0035891145     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac0107150     Document Type: Article
Times cited : (113)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.