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Volumn 64, Issue 19, 2001, Pages 1953311-1953317
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Field-induced transient hole transport in an Al0.3Ga0.7As-based p-i-n nanostructure studied by picosecond Raman spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ARSENIC;
GALLIUM;
ARTICLE;
ELECTRIC FIELD;
ELECTRON TRANSPORT;
RAMAN SPECTROMETRY;
SIMULATION;
STRUCTURE ANALYSIS;
SYSTEM ANALYSIS;
VELOCITY;
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EID: 0035891042
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (41)
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