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Volumn 90, Issue 8, 2001, Pages 3879-3886

Chemical vapor deposition of Si on chlorosilane-treated SiO2 surfaces. I. Suppression and enhancement of Si nucleation

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EID: 0035886147     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1402977     Document Type: Article
Times cited : (8)

References (24)
  • 14
    • 12444332894 scopus 로고
    • Although the surface Si-H bonds are reported to disappear upon the UV-ozone oxidation [tor example, M. Niwano, J.-I. Kagetama, K. Kinashi, and N. Miyamoto, J. Vac. Sci. Technol. A 12, 465 (1994)], no spectroscopic evidence tor the Si-OH formation has been reported.
    • (1994) J. Vac. Sci. Technol. A , vol.12 , pp. 465
    • Niwano, M.1    Kagetama, J.-I.2    Kinashi, K.3    Miyamoto, N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.