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Volumn 90, Issue 8, 2001, Pages 3743-3749

Metallic contamination in hydrogen plasma immersion ion implantation of silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035886116     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1404422     Document Type: Article
Times cited : (11)

References (21)
  • 11
    • 0040887759 scopus 로고    scopus 로고
    • US patent No. 6,120,660
    • US patent No. 6,120,660.
  • 13
    • 0040293530 scopus 로고    scopus 로고
    • J. Matossian, G. A. Collins, P. K. Chu, C. P. Munson, and J. V. Mantese, in Ref. 9, Chap. 6, p. 343
    • J. Matossian, G. A. Collins, P. K. Chu, C. P. Munson, and J. V. Mantese, in Ref. 9, Chap. 6, p. 343.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.