Preparation and properties of Bi2Ti2O7 thin films by chemical solution deposition

Materials Research Bulletin

Volumn 36, Issue 11, 2001, Pages 1949-1956

  Xiao, Zhuobing ^a   Wu, Xianming ^a   Wang, Shaowei ^b   Wang, Hong ^b   Wang, Zhuo ^b   Shan, Shuxia ^b   Wang, Min ^b  

^a JISHOU UNIVERSITY   (China)

^b SHANDONG UNIVERSITY   (China)

Author keywords

A. thin films; B. thermogravimetric analysis; B. X ray diffraction; D. dielectric properties

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; CRYSTALLIZATION; LEAKAGE CURRENTS; PERMITTIVITY; SUBSTRATES; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

CHEMICAL SOLUTION DEPOSITIONS;

THIN FILMS;

EID: 0035885418     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(01)00676-6     Document Type: Article

References (11)