Dissipative process in atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 11, 2001, Pages

  Leng, Yongsheng ^a   Jiang, Shaoyi ^a  

^a University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; ENTROPY; FRICTION; MATHEMATICAL COMPUTING; MOLECULAR DYNAMICS; SURFACE PLASMON RESONANCE; SURFACE TENSION; TEMPERATURE;

EID: 0035884044     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.115415     Document Type: Article

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