Defect dynamics and damage of cement-based materials, studied by electrical resistance measurement

Journal of Materials Science

Volumn 36, Issue 18, 2001, Pages 4351-4360

  Cao, Jingyao ^a   Wen, Sihai ^a   Chung, D D L ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONCRETES; INTERFACES (MATERIALS); MORTAR; SAND; STRESS ANALYSIS; STRUCTURAL LOADS;

CEMENT PASTES;

CEMENTS;

EID: 0035883317     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1017901929264     Document Type: Article

References (31)