Tracer-diffusion of 44Ti in TiAl single crystal

Materials Science and Engineering: A

Volumn 312, Issue 1-2, 2001, Pages 155-159

  Ikeda, T ^a   Kadowaki, H ^a   Nakajima, H ^a   Inui, H ^b   Yamaguchi, M ^b   Koiwa, M ^b  

^a OSAKA UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

Intermetallic compound; L10 type structure; TiAl; Tracer diffusion

Indexed keywords

ANISOTROPY; BINARY ALLOYS; DIFFUSION IN SOLIDS; INTERMETALLICS; ION BEAMS; POINT DEFECTS; SINGLE CRYSTALS; SPUTTERING;

ION BEAM SPUTTERING; TITANIUM ALUMINIDE; VACANCIES;

TITANIUM ALLOYS;

PHASE CHANGE;

EID: 0035882715     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01871-2     Document Type: Article

References (13)