High resolution microscopy study in Cr3C2-doped WC-Co

Journal of Materials Science

Volumn 36, Issue 16, 2001, Pages 3885-3890

  Yamamoto, T ^a   Ikuhara, Y ^a   Watanabe, T ^a   Sakuma, T ^a   Taniuchi, Y ^b   Okada, K ^b   Tanase, T ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b MITSUBISHI MATERIALS CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CRYSTAL LATTICES; DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLOGRAPHIC MICROSTRUCTURE; MORPHOLOGY; SEGREGATION (METALLOGRAPHY);

GRAIN ORIENTATION;

TUNGSTEN CARBIDE;

EID: 0035880654     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1017953701641     Document Type: Article

References (12)