Breakdown of valve metal passivity induced by aggressive anions

Electrochimica Acta

Volumn 46, Issue 24-25, 2001, Pages 3777-3781

  Magnussen, O M ^a   Zitzler, L ^a   Gleich, B ^a   Vogt, M R ^a   Behm, R J ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

Anodic oxide films; Passivity breakdown; Radioactive tracer; Valve metals

Indexed keywords

ADSORPTION; DISSOLUTION; ELECTROCHEMISTRY; NEGATIVE IONS; NIOBIUM; RADIOACTIVE TRACERS; SOLVENTS; THIN FILMS;

OXIDE FILMS;

PASSIVATION;

EID: 0035880486     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(01)00664-8     Document Type: Article

References (15)