Fatigue testing of single crystalline silicon

Materials Science and Engineering: A

Volumn 309-310, Issue , 2001, Pages 233-236

  Legros, M ^a   Jacques, A ^a   George, A ^a  

^a INSTITUT JEAN LAMOUR   (France)

Author keywords

Cyclic loading; Fatigue; PSB; Si; Single crystal; TEM

Indexed keywords

DISLOCATIONS (CRYSTALS); FATIGUE TESTING; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

PERSISTENT SLIP BANDS; SINGLE CRYSTALLINE SILICON;

SINGLE CRYSTALS;

DISLOCATION; FATIGUE; PLASTIC DEFORMATION; SILICON;

EID: 0035879788     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01694-4     Document Type: Article

References (13)