Irregular resistance change in thin Ag film on Si substrate

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 40, Issue 6 B, 2001, Pages

  Iida, S ^a   Hiraoka, A ^a   Tai, T ^a   Noritake, H ^a  

^a OSAKA SANGYO UNIVERSITY   (Japan)

Author keywords

2D conduction; Electron density; Quantum dot; Subband

Indexed keywords

ARGON; CARRIER CONCENTRATION; CRYSTAL STRUCTURE; ELECTRIC RESISTANCE; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON; SEMICONDUCTOR QUANTUM DOTS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

ELECTRON COUPLINGS;

THIN FILMS;

EID: 0035874850     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.l618     Document Type: Article

References (17)