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Journal of Materials Science Letters

Volumn 20, Issue 12, 2001, Pages 1121-1123

MOS capacitor properties passivated with aluminum phosphate glasses and effects of metal electrodes

(1) Kobayashi, K a

a JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; ANNEALING; ELECTRODES; GLASS; INFRARED SPECTROSCOPY; INFRARED TRANSMISSION; MELTING; PASSIVATION; REFRACTIVE INDEX; SPECTROPHOTOMETERS; SPUTTER DEPOSITION; STAINLESS STEEL;

ALUMINUM PHOSPHATE; DRY-AIR-BUBBLING; METAL ELECTRODES;

MOS CAPACITORS;

EID: 0035874835 PISSN: 02618028 EISSN: None Source Type: Journal
DOI: 10.1023/A:1010940206706 Document Type: Article

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.