Investigation of white etching layers on rails by optical microscopy, electron microscopy, X-ray and synchroton X-ray diffraction

Materials Science and Engineering: A

Volumn 303, Issue 1-2, 2001, Pages 150-157

  Osterle W ^a   Rooch, H ^a   Pyzalla, A ^b   Wang, L ^b  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Cross sectional transmission electron microscopy; White etching layers; X ray diffraction

Indexed keywords

ETCHING;

EID: 0035874190     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)01842-6     Document Type: Article

References (25)