SCOPUS 정보 검색 플랫폼

Volumn 20, Issue 10, 2001, Pages 965-968

Effect of Ce doping on passive film electrical resistance of 316 stainless steel exposed to oxygenated pure water at 288°C and its relation to stress corrosion cracking

(3) Raja, K S a Watanabe, Y a Shoji, T a

a TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CORROSION RESISTANCE; ELECTRIC RESISTANCE; ELECTROCHEMISTRY; FILM GROWTH; STAINLESS STEEL; STRAIN RATE; STRESS CORROSION CRACKING;

OXYGENATED PURE WATER;

SEMICONDUCTOR DOPING;

EID: 0035872449 PISSN: 02618028 EISSN: None Source Type: Journal
DOI: 10.1023/A:1010909723426 Document Type: Article

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.