Spectroscopic and structural analysis of precursors to hexagonal close packed phases in C60 thin films

Synthetic Metals

Volumn 121, Issue 1-3, 2001, Pages 1145-1146

  Lawrence, J R ^a   Chambers, G ^a   Fenton, D ^a   Henderson, K ^a   Dalton, A B ^a   Byrne, H J ^a  

^a DUBLIN INSTITUTE OF TECHNOLOGY   (Ireland)

Author keywords

C60; DSC; Fullerene and derivatives; Raman; Thin films; X ray diffraction

Indexed keywords

ANNEALING; CHARGE TRANSFER; CHLORINE COMPOUNDS; DEPOSITION; DERIVATIVES; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRONIC PROPERTIES; LIGHT ABSORPTION; ORGANIC SOLVENTS; RAMAN SPECTROSCOPY; THIN FILMS; VACUUM APPLICATIONS; VAPORS; X RAY DIFFRACTION ANALYSIS;

CHLOROBENZENE; VACUUM DEPOSITION;

FULLERENES;

EID: 0035867237     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(00)01099-7     Document Type: Article

References (5)

1. M.S. Dresselhaus, G. Dresselhaus, and P.C. Eklund, Science of Fullerenes and Carbon Nanotubes. Academic Press, New York, 1996.
2. K, Kamarás, A. Breitschwerdt, S, Pekker, K. Fodor-Csorba, G. Faigel, M. Tegze. App. Phys. A 56 (1993) 231-233.
3. K. Henderson, G. Chambers, H.J. Byrne. Synthetic Metals 103 (1999) 2360-2361.
4. L.Akselrod, H.J Byrne, T.E. Sutto, S, Roth, Chem. Phys. Lett., 233, (1995) 436.
5. S. Kazaoui, N. Minami, Y. Tanabe, H.J. Byrne, A. Eilmes and P. Petelenz, Phys. Rev. B12, (1998) 7689.