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Volumn 119, Issue 1-3, 2001, Pages 31-34

X-ray diffraction and UV-Vis absorption studies of poly(di-n-hexylsilane) and poly(di-n-octylsilane) after quenching

Author keywords

Other conjugated and or conducting polymers; UV Vis NIR absorption; X ray diffraction

Indexed keywords

COOLING; LIGHT ABSORPTION; POLYSILANES; QUENCHING; X RAY DIFFRACTION ANALYSIS;

EID: 0035867199     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(00)00599-3     Document Type: Article
Times cited : (7)

References (24)
  • 10
    • 0003769840 scopus 로고    scopus 로고
    • Silicon-based polymers: The science and technology of their synthesis and applications
    • edited by J. Chojnowski, R.G. Jones, and W. Ando (Chapman and Hall, New York, London, 1999), Chap. in press
    • 10 J. Michl and R. West, in Silicon-based Polymers: The Science and Technology of their Synthesis and Applications, edited by J. Chojnowski, R.G. Jones, and W. Ando (Chapman and Hall, New York, London, 1999), Chap. Electronic Structure and Spectroscopy of Polysilanes, in press.
    • Electronic Structure and Spectroscopy of Polysilanes
    • Michl, J.1    West, R.2
  • 21
    • 0004945719 scopus 로고    scopus 로고
    • Ph.D. thesis, University of Wisconsin
    • 21 Ty Prosa, Ph.D. thesis, University of Wisconsin, 1996.
    • (1996)
    • Prosa, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.