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Volumn 20, Issue 2, 2001, Pages 179-181
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An examination of thin film lead scandium tantalum oxide (PST) using piezoAFM
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FERROELECTRIC THIN FILMS;
FERROELECTRICITY;
HYSTERESIS;
LEAD COMPOUNDS;
PIEZOELECTRIC MATERIALS;
PYROELECTRICITY;
RAPID THERMAL ANNEALING;
TRANSMISSION ELECTRON MICROSCOPY;
CURIE TEMPERATURE;
LEAD SCANDIUM TANTALUM OXIDE;
DIELECTRIC FILMS;
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EID: 0035862461
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1006752000016 Document Type: Article |
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Times cited : (11)
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References (8)
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