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Volumn 34, Issue 13, 2001, Pages 2757-
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Erratum: Electron spectrometry at the μeV level and the electron affinites of Si and F (J. Phys. B: At. Mol. Opt. Phys. 34 (L281-289))
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Author keywords
[No Author keywords available]
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Indexed keywords
ERRORS;
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EID: 0035859555
PISSN: 09534075
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-4075/34/13/701 Document Type: Erratum |
Times cited : (16)
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References (0)
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