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Volumn 38, Issue 32-33, 2001, Pages 5481-5508

Modeling and simulation of an impact test using wavelets, analytical solutions and finite elements

Author keywords

Finite elements; Impact; Signal analysis; Wavelets

Indexed keywords

FINITE ELEMENT METHOD; STRESS ANALYSIS; WAVELET TRANSFORMS;

EID: 0035859181     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0020-7683(00)00395-4     Document Type: Article
Times cited : (14)

References (24)
  • 20
    • 0004703449 scopus 로고    scopus 로고
    • SAMCEF Finite Element Program SAMTECH, S.A., Liège, Belgium
    • (1997)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.