Ellipsometry and spectroscopy of porous glass surfaces

Vacuum

Volumn 61, Issue 2-4, 2001, Pages 123-128

  Ovechko, V S ^a   Dmytruk, A M ^a   Fursenko, O V ^b   Lepeshkina, T P ^b  

^a TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

Ellipsometry; Hydroxyl group; Near infrared spectroscopy; Porous glass

Indexed keywords

ABSORPTION SPECTROSCOPY; ELLIPSOMETRY; EMISSION SPECTROSCOPY; INFRARED SPECTROSCOPY; LIGHT ABSORPTION; POROUS MATERIALS;

NEAR INFRARED SPECTROSCOPY; POROUS GLASS;

GLASS;

EID: 0035858594     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(00)00467-X     Document Type: Conference Paper

References (5)

1. Kiselev VF, Krylov OV. Adsorption process on semiconductor and dielectric surfaces I (Springer Series in Chemical Physics, vol. 32). Berlin: Springer-Verlag, 1985.
2. Ovechko V, Dmytruk A, Mygashko V, Mulenko S. Vibrl Spectrosc 2000;22/1-2:87-93.
3. Azzam RMA, Bashara NM. Ellipsometry and polarized light. Amsterdam: North-Holland, 1977.
4. Hobza P, Zahradnik R. Intermolecular complexes. Prague: Academia, 1988. p. 376.
5. Gribov L. Theory of infrared spectra of polymers. Moscow: Nauka, 1977. p. 240 (in Russian).