The electrical characteristics of random RC networks and the physical origin of 1/f noise

Journal of Physics Condensed Matter

Volumn 13, Issue 19, 2001, Pages

  Almond, D P ^a   Vainas, B ^b  

^a University of Bath   (United Kingdom)

^b SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; DIELECTRIC LOSSES; MATHEMATICAL MODELS; RESISTORS; SPURIOUS SIGNAL NOISE;

ELECTRICAL CHRACTERISTICS;

NETWORKS (CIRCUITS);

EID: 0035858392     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/13/19/101     Document Type: Article

References (8)

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4. Jonscher A K 1983 Dielectric Relaxation in Solids (London: Chelsea Dielectric)
5. Jonscher A K 1996 Universal Relaxation Law (London: Chelsea Dielectric)
6. Jonscher A K 1975 Colloid and Polymer Sci. 253 231
7. SIMetrix, Newbury Technology Ltd, Thatcham, Berks RG18 4LZ, UK
8. Dyre J C and Schroder T B 2000 Rev. Mod. Phys. 72 873