Photoluminescence method for detecting trace levels of iron in ultrapure silicon

Applied Physics Letters

Volumn 78, Issue 20, 2001, Pages 3070-3072

  Broussell, I ^a   Karasyuk, V A ^a,b   Thewalt, M L W ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

^b Creo Inc   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035858373     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1347018     Document Type: Article

References (14)

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