Investigation of the size-scaling behavior of spatially nonuniform barrier height contacts to semiconductor surfaces using ordered nanometer-scale nickel arrays on silicon electrodes

Journal of Physical Chemistry B

Volumn 105, Issue 49, 2001, Pages 12303-12318

  Rossi, Robert C ^a   Lewis, Nathan S ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTORESPONSE PROPERTIES;

CONTACTS (FLUID MECHANICS); CRYSTAL ORIENTATION; DEPOSITION; ELECTRODES; EVAPORATION; LITHOGRAPHY; MASKS; POLYSTYRENES; SCHOTTKY BARRIER DIODES;

SURFACE CHEMISTRY;

EID: 0035857210     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp011861c     Document Type: Article

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