SCOPUS 정보 검색 플랫폼

Polymer

Volumn 43, Issue 1, 2001, Pages 77-85

Intermolecular segregation of siloxane in P3HT: Surface quantification and molecular surface-structure

(5) Ponjee M W G a Reijme, M A a Denier van der Gon, A W a Brongersma, H H a Langeveld Voss, B M W a

a EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

Intermolecular surface segregation; Low Energy Ion Scattering (LEIS, ISS); Poly(3 hexyl)thiophene siloxane)(P3HT DMS)

Indexed keywords

FREE ENERGY; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; MONOMERS; SCATTERING; SEGREGATION (METALLOGRAPHY); SPIN COATING; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

POLYMER FILMS; SURFACE FREE ENERGY;

PLASTIC FILMS;

POLY(3 HEXYLTHIOPHENE); POLYMER; SILOXANE; UNCLASSIFIED DRUG;

ACCELERATION; ARTICLE; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; CONCENTRATION RESPONSE; MODEL; QUANTITATIVE ASSAY; SPECTROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; X RAY ANALYSIS;

FILM;

EID: 0035850806 PISSN: 00323861 EISSN: None Source Type: Journal
DOI: 10.1016/S0032-3861(01)00597-3 Document Type: Article

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.