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Volumn 323, Issue 324, 2001, Pages 107-110
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Gd thin films: Relationship between elastic properties and microstructure
a a a a a |
Author keywords
Elasticity; Inelastic light scattering; Thin films; Vapour deposition; X ray diffraction
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Indexed keywords
ACOUSTIC WAVES;
ARGON;
BRILLOUIN SCATTERING;
DENSITY (SPECIFIC GRAVITY);
ELASTICITY;
GADOLINIUM;
MAGNETRON SPUTTERING;
MICROSTRUCTURE;
SILICON;
SPECTROSCOPIC ANALYSIS;
SPUTTER DEPOSITION;
SURFACE WAVES;
TEXTURES;
THIN FILMS;
VAPOR DEPOSITION;
X RAY DIFFRACTION ANALYSIS;
SURFACE BRILLOUIN LIGHT SCATTERING SPECTROSCOPY;
METALLIC FILMS;
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EID: 0035850149
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(01)00984-7 Document Type: Article |
Times cited : (4)
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References (10)
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