Surface roughness and surface force measurement: A comparison of electrostatic potentials derived from atomic force microscopy and electrophoretic mobility measurements

Langmuir

Volumn 17, Issue 25, 2001, Pages 7777-7783

  Considine, Robert F ^a,b   Drummond, Calum J ^a  

^a CSIRO   (Australia)

^b MELBOURNE WATER CORPORATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

REPULSIVE FORCES;

ATOMIC FORCE MICROSCOPY; COLLOIDS; ELECTRIC POTENTIAL; ELECTROLYTES; ELECTROPHORESIS; ELECTROSTATICS; FORCE MEASUREMENT; IONIC STRENGTH; SURFACE ROUGHNESS; VAN DER WAALS FORCES;

SILICA;

EID: 0035846804     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0017227     Document Type: Article

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