-
2
-
-
0030590366
-
-
Jennings, G.K.; Laibinis, P.E. Colloids Surf., A 1996, 116, 105-114.
-
(1996)
Colloids Surf., A
, vol.116
, pp. 105-114
-
-
Jennings, G.K.1
Laibinis, P.E.2
-
3
-
-
0031356064
-
-
Scherer, J.; Vogt, M.R.; Magnussen, O.M.; Behm, R.J. Langmuir 1997, 13, 7045-7051.
-
(1997)
Langmuir
, vol.13
, pp. 7045-7051
-
-
Scherer, J.1
Vogt, M.R.2
Magnussen, O.M.3
Behm, R.J.4
-
4
-
-
0030871139
-
-
Feng, Y.Q.; Teo, W.K.; Siow, K.S.; Gao, Z.Q.; Tan, K.L.; Hsieh, A.K. J. Electrochem. Soc. 1997, 144, 55-64.
-
(1997)
J. Electrochem. Soc.
, vol.144
, pp. 55-64
-
-
Feng, Y.Q.1
Teo, W.K.2
Siow, K.S.3
Gao, Z.Q.4
Tan, K.L.5
Hsieh, A.K.6
-
5
-
-
0032183363
-
-
Jennings, G.K.; Munro, J.C.; Yong, T.-H.; Laibinis, P.E. Langmuir 1998, 14, 6130-6139.
-
(1998)
Langmuir
, vol.14
, pp. 6130-6139
-
-
Jennings, G.K.1
Munro, J.C.2
Yong, T.-H.3
Laibinis, P.E.4
-
6
-
-
0027542650
-
-
Yamamoto, Y.; Nishihara, H.; Aramaki, K. J. Electrochem. Soc. 1993, 140, 436-442.
-
(1993)
J. Electrochem. Soc.
, vol.140
, pp. 436-442
-
-
Yamamoto, Y.1
Nishihara, H.2
Aramaki, K.3
-
7
-
-
0028486062
-
-
Itoh, M.; Nishihara, H.; Aramaki, K. J. Electrochem. Soc. 1994, 141, 2018-2023.
-
(1994)
J. Electrochem. Soc.
, vol.141
, pp. 2018-2023
-
-
Itoh, M.1
Nishihara, H.2
Aramaki, K.3
-
8
-
-
0034250342
-
-
Shon, Y.-S.; Gross, S.M.; Dawson, B.; Porter, M.; Murray, R.W. Langmuir 2000, 16, 6555-6561.
-
(2000)
Langmuir
, vol.16
, pp. 6555-6561
-
-
Shon, Y.-S.1
Gross, S.M.2
Dawson, B.3
Porter, M.4
Murray, R.W.5
-
9
-
-
0032653831
-
-
Lukkari, J.; Meretoja, M.; Kartio, I.; Laajalehto, K.; Rajamäki, M.; Lindström, M.; Kankare, J. Langmuir 1999, 15, 3529-3537.
-
(1999)
Langmuir
, vol.15
, pp. 3529-3537
-
-
Lukkari, J.1
Meretoja, M.2
Kartio, I.3
Laajalehto, K.4
Rajamäki, M.5
Lindström, M.6
Kankare, J.7
-
10
-
-
0011476658
-
-
Hsueh, C.-C.; Lee, M.-T.; Freund, M.S.; Ferguson, G.S. Angew. Chem., Int. Ed. 2000, 39, 1227-1230.
-
(2000)
Angew. Chem., Int. Ed.
, vol.39
, pp. 1227-1230
-
-
Hsueh, C.-C.1
Lee, M.-T.2
Freund, M.S.3
Ferguson, G.S.4
-
11
-
-
0032477995
-
-
Jung, Ch.; Dannenberger, O.; Yue, X.; Buck, M.; Grunze, M. Langmuir 1998, 14, 1103-1107.
-
(1998)
Langmuir
, vol.14
, pp. 1103-1107
-
-
Jung, Ch.1
Dannenberger, O.2
Yue, X.3
Buck, M.4
Grunze, M.5
-
12
-
-
0034300103
-
-
Yan, D.; Saunders, J.A.; Jennings, G.K. Langmuir 2000, 16, 7562-7565.
-
(2000)
Langmuir
, vol.16
, pp. 7562-7565
-
-
Yan, D.1
Saunders, J.A.2
Jennings, G.K.3
-
13
-
-
0342459190
-
-
Laibinis, P.E.; Whitesides, G.M.; Allara, D.L.; Tao, Y.-T.; Parikh, A.N. J. Am. Chem. Soc. 1991, 113, 7152-7167.
-
(1991)
J. Am. Chem. Soc.
, vol.113
, pp. 7152-7167
-
-
Laibinis, P.E.1
Whitesides, G.M.2
Allara, D.L.3
Tao, Y.-T.4
Parikh, A.N.5
-
14
-
-
0030156740
-
-
Zhao, X.-M.; Wilbur, J.L.; Whitesides, G.M. Langmuir 1996, 12, 3257-3264.
-
(1996)
Langmuir
, vol.12
, pp. 3257-3264
-
-
Zhao, X.-M.1
Wilbur, J.L.2
Whitesides, G.M.3
-
15
-
-
0011384782
-
-
note
-
12TS onto copper in water at 40 °C or in ethanol at 23 °C. Longer exposures (∼30 min) resulted in no significant improvement in barrier properties. Exposure times could not be greatly increased due to the observation of multilayers for times greater than 45 min.
-
-
-
-
16
-
-
0011384070
-
-
note
-
SAMs formed in water at 40 °C resulted in films with comparable resistance and improved capacitance in approximately one sixth the time required for films formed in water at room temperature. Additional studies at 50 and 60 °C showed little improvement over 40 °C, as indicated by comparable IR spectra and resistance/capacitance values from EIS spectra.
-
-
-
-
18
-
-
0032069401
-
-
Janek, R.P.; Fawcett, W.R.; Ulman, A. Langmuir 1998, 14, 3011-3018.
-
(1998)
Langmuir
, vol.14
, pp. 3011-3018
-
-
Janek, R.P.1
Fawcett, W.R.2
Ulman, A.3
-
19
-
-
0011439566
-
-
note
-
For a highly crystalline alkanethiolate SAM on copper, the average molecular cant is approximately 12° from the surface normal (see ref 13).
-
-
-
-
20
-
-
1942481178
-
-
Bain, C.D.; Troughton, E.B.; Tao, Y.-T.; Evall, J.; Whitesides, G.M.; Nuzzo, R.G. J. Am. Chem. Soc. 1989, 111, 321-335.
-
(1989)
J. Am. Chem. Soc.
, vol.111
, pp. 321-335
-
-
Bain, C.D.1
Troughton, E.B.2
Tao, Y.-T.3
Evall, J.4
Whitesides, G.M.5
Nuzzo, R.G.6
-
22
-
-
0032791668
-
-
Lestelius, M.; Engquist, I.; Tengrall, P.; Chaudhury, M.K.; Leidberg, B. Colloids Surf., B 1999, 15, 57-70.
-
(1999)
Colloids Surf., B
, vol.15
, pp. 57-70
-
-
Lestelius, M.1
Engquist, I.2
Tengrall, P.3
Chaudhury, M.K.4
Leidberg, B.5
-
23
-
-
0032637685
-
-
Jennings, G.K.; Munro, J.C.; Laibinis, P.E. Adv. Mater. 1999, 11, 1000-1003.
-
(1999)
Adv. Mater.
, vol.11
, pp. 1000-1003
-
-
Jennings, G.K.1
Munro, J.C.2
Laibinis, P.E.3
-
24
-
-
0011477970
-
-
note
-
XPS spectra were obtained at low resolution to improve sensitivity and enable shorter acquisition times to reduce the amount of X-ray beam damage to the sample.
-
-
-
-
26
-
-
0011430886
-
-
note
-
After removal from solution, the SAM-coated copper samples were exposed to ambient conditions for ∼3 h before being transferred into the XPS chamber.
-
-
-
-
28
-
-
0028436508
-
-
Keller, H.; Simak, P.; Schrepp, W.; Dembowski, J. Thin Solid Films 1994, 244, 799-805.
-
(1994)
Thin Solid Films
, vol.244
, pp. 799-805
-
-
Keller, H.1
Simak, P.2
Schrepp, W.3
Dembowski, J.4
-
30
-
-
0029310050
-
-
Ling, Y.; Guan, Y.; Han, K.N. Corrosion 1995, 51, 367-375.
-
(1995)
Corrosion
, vol.51
, pp. 367-375
-
-
Ling, Y.1
Guan, Y.2
Han, K.N.3
-
31
-
-
0001308104
-
-
Polewska, W.; Vogt, M.R.; Magnussen, O.M.; Behm, R.J. J. Phys. Chem. B 1999, 103, 10440-10451.
-
(1999)
J. Phys. Chem. B
, vol.103
, pp. 10440-10451
-
-
Polewska, W.1
Vogt, M.R.2
Magnussen, O.M.3
Behm, R.J.4
-
32
-
-
0032118179
-
-
Vogt, M.R.; Nichols, R.J.; Magnussen, O.M.; Behm, R.J. J. Phys. Chem. B 1998, 102, 5859-5865.
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 5859-5865
-
-
Vogt, M.R.1
Nichols, R.J.2
Magnussen, O.M.3
Behm, R.J.4
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