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Volumn 17, Issue 25, 2001, Pages 7830-7836

Characterization of self-assembled monolayers formed from sodium S-alkyl thiosulfates on copper

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR-SCALE DEFECTS;

EID: 0035846779     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la010816t     Document Type: Article
Times cited : (87)

References (32)
  • 15
    • 0011384782 scopus 로고    scopus 로고
    • note
    • 12TS onto copper in water at 40 °C or in ethanol at 23 °C. Longer exposures (∼30 min) resulted in no significant improvement in barrier properties. Exposure times could not be greatly increased due to the observation of multilayers for times greater than 45 min.
  • 16
    • 0011384070 scopus 로고    scopus 로고
    • note
    • SAMs formed in water at 40 °C resulted in films with comparable resistance and improved capacitance in approximately one sixth the time required for films formed in water at room temperature. Additional studies at 50 and 60 °C showed little improvement over 40 °C, as indicated by comparable IR spectra and resistance/capacitance values from EIS spectra.
  • 19
    • 0011439566 scopus 로고    scopus 로고
    • note
    • For a highly crystalline alkanethiolate SAM on copper, the average molecular cant is approximately 12° from the surface normal (see ref 13).
  • 24
    • 0011477970 scopus 로고    scopus 로고
    • note
    • XPS spectra were obtained at low resolution to improve sensitivity and enable shorter acquisition times to reduce the amount of X-ray beam damage to the sample.
  • 26
    • 0011430886 scopus 로고    scopus 로고
    • note
    • After removal from solution, the SAM-coated copper samples were exposed to ambient conditions for ∼3 h before being transferred into the XPS chamber.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.