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Journal of Applied Polymer Science

Volumn 81, Issue 2, 2001, Pages 340-349

X-ray diffraction studies on reverse-annealed polyethylenes

(3) Cser, F a Hopewell, J L a Shanks, R A b

a Department of Civil and Environmental Engineering (Australia)

b RMIT UNIVERSITY (Australia)

Author keywords

Annealing; Coupled system; Particle size; Polyethylene; X ray diffraction

Indexed keywords

ANNEALING; ATOMS; CARBON; CRYSTALLINE MATERIALS; CRYSTALLIZATION; ESTIMATION; MATHEMATICAL MODELS; PARTICLE SIZE ANALYSIS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

COUPLED SYSTEM; FLORY CONCEPT; MELTING TEMPERATURE DEPRESSION; RADIUS OF GYRATION; SMALL ANGLE X RAY SCATTERING; THOMPSON-GIBBS FORMULA; WIDE ANGLE X RAY SCATTERING;

POLYETHYLENES;

EID: 0035845062 PISSN: 00218995 EISSN: None Source Type: Journal
DOI: 10.1002/app.1444 Document Type: Article

Times cited : (5)

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