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Volumn 40, Issue 14, 2001, Pages 3042-3047

Measuring particle diameter and particle - Particle gap with nanometer precision using an optical microscope

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; LIGHT SCATTERING; OPTICAL MICROSCOPY; POLYSTYRENES; POTASSIUM COMPOUNDS; SILICA;

EID: 0035844949     PISSN: 08885885     EISSN: None     Source Type: Journal    
DOI: 10.1021/ie000664h     Document Type: Article
Times cited : (3)

References (27)
  • 10
  • 18
    • 0000739073 scopus 로고
    • Optical measurement of picometer displacements of transparent microscopic objects
    • (1990) Appl. Opt. , vol.29 , pp. 2382
    • Denk, W.1    Webb, W.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.