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Volumn 40, Issue 14, 2001, Pages 3042-3047
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Measuring particle diameter and particle - Particle gap with nanometer precision using an optical microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
IMAGE PROCESSING;
LIGHT SCATTERING;
OPTICAL MICROSCOPY;
POLYSTYRENES;
POTASSIUM COMPOUNDS;
SILICA;
PARTICLE DIAMETERS;
NANOSTRUCTURED MATERIALS;
POLYSTYRENE;
POTASSIUM CHLORIDE;
SILICON DIOXIDE;
MICROSCOPY;
OPTICAL TECHNIQUE;
PARTICLE SIZE ANALYSIS;
ACCURACY;
ARTICLE;
COLLOID;
ELECTRON MICROSCOPY;
IMAGE PROCESSING;
LIGHT SCATTERING;
MEASUREMENT;
MICROSCOPY;
NANOPARTICLE;
PARTICLE SIZE;
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EID: 0035844949
PISSN: 08885885
EISSN: None
Source Type: Journal
DOI: 10.1021/ie000664h Document Type: Article |
Times cited : (3)
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References (27)
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