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Volumn 20, Issue 12, 2001, Pages 2525-2532

Syntheses and structural characterization of ferrocene-containing double-helicate and mononuclear copper(II) and silver(I) complexes

Author keywords

[No Author keywords available]

Indexed keywords

FERROCENE; SCHIFF-BASE LIGANDS; X-RAY STRUCTURAL ANALYSIS;

EID: 0035844919     PISSN: 02767333     EISSN: None     Source Type: Journal    
DOI: 10.1021/om000965r     Document Type: Article
Times cited : (55)

References (57)
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    • Lehn, J.-M., Atwood, J. L., Davies, J. E. D., MacNicol, D. D., Vögtal, F., Eds.; Pergamon: Oxford
    • (a) Lehn, J.-M., Atwood, J. L., Davies, J. E. D., MacNicol, D. D., Vögtal, F., Eds. Comprehensive Supramolecular Chemistry; Pergamon: Oxford, 1996; Vol. 9, pp 213-252.
    • (1996) Comprehensive Supramolecular Chemistry , vol.9 , pp. 213-252
  • 32
    • 0003992987 scopus 로고
    • Report PRNL-3794; Oak Ridge National Laboratory: Oak Ridge, TN
    • Johnson, C. K. ORTEP; Report PRNL-3794; Oak Ridge National Laboratory: Oak Ridge, TN, 1994.
    • (1994) ORTEP
    • Johnson, C.K.1
  • 49
    • 0003763724 scopus 로고    scopus 로고
    • "Collect" data collection software
    • Delft, The Netherlands
    • "Collect" data collection software, Nonius, B.V., Delft, The Netherlands, 1998.
    • (1998)
    • Nonius, B.V.1
  • 52
    • 0003666167 scopus 로고    scopus 로고
    • MaXus: A computer program for the solution and refinement of crystal structures from diffraction data
    • University of Glasgow, Scotland, U.K.
    • (b) Mackay, S.; Gilmore, C. J.; Tremayne, M.; Stuart, N.; Shankland, K. maXus: a computer program for the solution and refinement of crystal structures from diffraction data, University of Glasgow, Scotland, U.K.
    • Mackay, S.1    Gilmore, C.J.2    Tremayne, M.3    Stuart, N.4    Shankland, K.5
  • 53
    • 0011531387 scopus 로고    scopus 로고
    • Delft, The Netherlands, and MacScience Co. Ltd., Yokohama, Japan
    • Nonius B.V., Delft, The Netherlands, and MacScience Co. Ltd., Yokohama, Japan, 1998.
    • (1998)
    • Nonius, B.V.1
  • 56
    • 0004238749 scopus 로고
    • Siemens Analytical X-ray Instruments, Inc., Madison, WI
    • XSCANS, Version 2.1, Siemens Analytical X-ray Instruments, Inc., Madison, WI, 1994.
    • (1994) XSCANS, Version 2.1
  • 57
    • 0004150157 scopus 로고
    • Siemens Industrial Automation, Inc. Analytical Instrumentation, Madison, WI
    • SHELXTL, Version 5.0, Siemens Industrial Automation, Inc. Analytical Instrumentation, Madison, WI, 1995.
    • (1995) SHELXTL, Version 5.0


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.