Measurement of the mechanical loss of crystalline samples using a nodal support

Physics Letters, Section A: General, Atomic and Solid State Physics

Volumn 284, Issue 4-5, 2001, Pages 162-171

  Numata, Kenji ^a   Bertolotto Bianc, Giuseppe ^b   Tanaka, Mitsuru ^b   Otsuka, Shigemi ^a   Kawabe, Keita ^a   Ando, Masaki ^a   Tsubono, Kimio ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Gravitational waves; Nodal support; Quality factor; Sapphire; Silicon; Thermal noise

Indexed keywords

GRAVITY WAVES; SILICON; THERMAL NOISE;

CRYSTALLINE SAMPLES; MECHANICAL LOSS; QUALITY FACTORS; SILICON SAMPLES; SURFACE LOSS;

SAPPHIRE;

SAPPHIRE; SILICON; UNCLASSIFIED DRUG;

ANISOTROPY; ARTICLE; CRYSTAL STRUCTURE; ENVIRONMENTAL TEMPERATURE; GRAVITY; MATHEMATICAL COMPUTING; QUALITY CONTROL; QUANTUM MECHANICS; SAMPLING; SURFACE PROPERTY;

EID: 0035844639     PISSN: 03759601     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0375-9601(01)00311-5     Document Type: Article

References (17)