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Volumn 71, Issue 3, 2001, Pages 226-234
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Physical evaluation and electrical properties in glassy semiconductors a-GeTe4Mx
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Author keywords
Chalcogenide glasses; Conductivity; Scanning electron microscope; Thin films
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Indexed keywords
AMORPHOUS FILMS;
ELECTRIC CONDUCTIVITY OF SOLIDS;
EVAPORATION;
HEAT TREATMENT;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING GERMANIUM COMPOUNDS;
THERMAL EFFECTS;
THIN FILMS;
CHALCOGENIDE GLASS;
SEMICONDUCTING GLASS;
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EID: 0035840395
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/S0254-0584(01)00290-5 Document Type: Article |
Times cited : (5)
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References (15)
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