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Volumn 488, Issue 3, 2001, Pages 399-405
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An STM study of the Si(0 0 1)(2 × 4)-Dy surface
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Author keywords
Lanthanides; Scanning tunneling microscopy; Silicides; Silicon; Surface structure, morphology, roughness, and topography
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Indexed keywords
DYSPROSIUM;
MORPHOLOGY;
SCANNING TUNNELING MICROSCOPY;
SURFACE ROUGHNESS;
SURFACE TREATMENT;
STRANSKI-KRASTANOV GROWTH MODE;
SURFACE RECONSTRUCTION;
SILICON;
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EID: 0035839152
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)01159-1 Document Type: Article |
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Times cited : (34)
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References (8)
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