Improving visual inspection using binocular rivalry

International Journal of Production Research

Volumn 39, Issue 10, 2001, Pages 2143-2153

  Drury, Colin G ^a   Maheswar, Girish ^b   Das, Aniruddha ^a   Helander, Martin G ^c  

^a the State University of New York   (United States)

^b Public Cloud Infrastructure and Technology   (United States)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED MANUFACTURING; COMPUTER INTEGRATED MANUFACTURING; INSPECTION; PRODUCTION ENGINEERING; QUALITY CONTROL;

AUTOMATED VISION SYSTEMS; VISUAL INSPECTION SYSTEMS;

FACTORY AUTOMATION;

EID: 0035838753     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540110038504     Document Type: Article

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