Oxygen-deficient SnO2(110): A STM, LEED and XPS study

Surface Science

Volumn 477, Issue 1, 2001, Pages 50-58

  Sinner Hettenbach, M ^a   Gothelid M ^b   Weissenrieder, J ^b   Von Schenck, H ^b   Weiss T ^a   Barsan, N ^a   Weimar, U ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

Low energy electron diffraction (LEED); Photoelectron spectroscopy; Scanning tunneling microscopy; Single crystal surfaces; Tin oxides

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; HIGH TEMPERATURE EFFECTS; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

TIN OXIDES;

SEMICONDUCTING TIN COMPOUNDS;

EID: 0035836574     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)00705-1     Document Type: Article

References (16)