SCOPUS 정보 검색 플랫폼

Powder Technology

Volumn 118, Issue 1-2, 2001, Pages 180-187

Extending laser diffraction for particle shape characterization: Technical aspects and application

(3) Ma, Zhenhua a Merkus, Henk G a Scarlett, Brian a

a DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

Laser diffraction; On line measurement; Particle shape

Indexed keywords

DIFFRACTION; FOURIER TRANSFORMS; LASER APPLICATIONS; LIGHT SCATTERING; ONLINE SYSTEMS; PROCESS CONTROL;

LASER DIFFRACTION;

PARTICLE SIZE ANALYSIS;

DIFFRACTION; LASER; PARTICLE; POWDER; SHAPE;

ARTICLE; CONTROLLED STUDY; CRYSTAL; DEVICE; FOURIER ANALYSIS; LASER DIFFRACTION; MEASUREMENT; NETHERLANDS; NONHUMAN; ONLINE SYSTEM; PARTICLE SIZE; PRINCIPAL COMPONENT ANALYSIS; PROCESS CONTROL; TECHNIQUE;

EID: 0035828105 PISSN: 00325910 EISSN: None Source Type: Journal
DOI: 10.1016/S0032-5910(01)00309-6 Document Type: Article

Times cited : (42)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.