Ab initio structure determination of BiPb2VO6 from powder diffraction data

Chemical Communications

Volumn 1, Issue 19, 2001, Pages 1984-1985

  Evans, Ivana Radosavljevic ^a   Howard, Judith A K ^a   Withers, Ray L ^b   Evans, John S O ^a  

^a DURHAM UNIVERSITY   (United Kingdom)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH DERIVATIVE; LEAD; VANADIUM DERIVATIVE;

ARTICLE; CRYSTAL STRUCTURE; NEUTRON SCATTERING; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; SYNTHESIS; X RAY POWDER DIFFRACTION;

EID: 0035823768     PISSN: 13597345     EISSN: 1364548X     Source Type: Journal    
DOI: 10.1039/b105242j     Document Type: Article

References (16)

1. J. C. Boivin and G. Mairesse, Chem. Mater., 1998, 10, 2870.
2. A. W. Sleight, H. Y. Chen, A. Ferretti and D. E. Cox, Mater. Res. Bull., 1979, 14, 1571.
3. L. Balducci and M. Rustioni, U. S. Pat., 4,230,500, 1980.
4. A. Mizrahi, J. P. Wignacour and H. Steinfink, J. Solid State Chem., 1997, 133, 516.
5. I. Radosavljevic, J. S. O. Evans and A. W. Sleight, J. Solid State Chem., 1998, 137, 143.
6. I. Radosavljevic, J. S. O. Evans and A. W. Sleight, J. Solid State Chem., 1998, 141, 149.
7. I. Radosavljevic, J. S. O. Evans and A. W. Sleight, J. Alloys Compd., 1999, 284, 99.
8. I. Radosavljevic and A. W. Sleight, J. Solid State Chem., 2000, 149, 143.
9. I. Radosavljevic, J. A. K. Howard and A. W. Sleight, Int. J. Inorg. Mater., 2000, 2, 543.
10. A. Mizrahi, J. P. Wignacourt, M. Drache and P. Conflant, J. Mater. Chem., 1995, 5, 901.
11. J. W. Visser, J. Appl. Crystallogr., 1969, 2, 89.
12. Y. Porter, K. M. Ok, N. S. P. Bhuvanesh and P. Shiv Halasyamani, Chem. Mater., 2001, 13, 1910.
13. A. Altomare, M. C. Burla, G. Cascarno, C. Giacovazzo, A. Guagliardi, A. G. G. Moliterni and G. Polidori, J. Appl. Crystallogr., 1995, 28, 842.
14. O. B. Lapina, V. M. Mastikhin, V. N. Krasilnikov and K. I. Zamaraev, Prog. NMR Spectrosc., 1992, 24, 457.
15. Topas v2.0: General Profile and Structure Analysis Software for Powder Diffraction Data, Bruker AXS, Karlsruhe, Germany, 2000.
16. A. A. Coelho, J. Appl. Crystallogr., 2000, 33, 899.