Surface crack detection using flanged parallel-plate waveguide

Electronics Letters

Volumn 37, Issue 25, 2001, Pages 1526-1527

  Park, H H ^a   Cho, Y H ^a   Eom, H J ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; RECTANGULAR WAVEGUIDES; SURFACE PROPERTIES;

MODE-MATCHING TECHNIQUES; PARALLEL-PLATE WAVEGUIDES; SURFACE CRACK DETECTION;

CRACKS;

EID: 0035818852     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20011051     Document Type: Article

References (2)

1. A novel microwave method for detection of long surface cracks in metals
2. An analytic series solution for E-plane T-junction in parallel-plate waveguide