Modelling and measuring the reflection and transmission of a silicon wafer in the X- and Ka-bands under illumination of light in a closed waveguide structure

Microwave and Optical Technology Letters

Volumn 31, Issue 5, 2001, Pages 349-353

  Hajian, M ^a   Heijnen, S H ^a   Groen, F ^a   Hakkert, P ^a   Ligthart, L P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Microwave photonics; Microwave optical interaction; Transmission and reflection

Indexed keywords

LIGHT PROPAGATION; LIGHT TRANSMISSION; RADIATION; REFLECTION; SEMICONDUCTOR DOPING; SILICON WAFERS;

MICROWAVE PHOTONICS;

OPTICAL WAVEGUIDES;

EID: 0035814170     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.10031     Document Type: Article

References (4)

1. Concept of a scanning beam antenna at 35 GHz based on photoconductivity technology